Serial Sectioning of Deformed Microcrystals using a...

Serial Sectioning of Deformed Microcrystals using a Dual-Beam FIB-SEM Microscope

Uchic, MD, Shade, PA
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Volume:
15
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927609099498
Date:
July, 2009
File:
PDF, 925 KB
2009
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