Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope
Balogh, MP, Dutta, IVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610054310
Date:
July, 2010
File:
PDF, 609 KB
english, 2010