Analytical Aberration-Corrected STEM of Ferroelectric...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Analytical Aberration-Corrected STEM of Ferroelectric Functional Interfaces

Ramasse, QM, Arredondo, M, Weyland, M, Mahjoub, R, Vrejoiu, I, Hesse, D, Browning, ND, Alexe, M, Munroe, P, Nagarajan, V
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610056370
Date:
July, 2010
File:
PDF, 1.56 MB
english, 2010
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