Comparison of Exchange-Bias Using Epitaxial and...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study

Kohn, A, Kovacs, A, Wang, S-G, Wang, C, Dean, J, Schrefl, T, Zeltser, A, Carey, MJ, Petford-Long, AK, C Ward, RC
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610056515
Date:
July, 2010
File:
PDF, 4.69 MB
english, 2010
Conversion to is in progress
Conversion to is failed