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Comparison of Exchange-Bias Using Epitaxial and Polycrystalline Ir0.2Mn0.8 Antiferromagnetic Thin Films: a TEM and Lorentz TEM Study
Kohn, A, Kovacs, A, Wang, S-G, Wang, C, Dean, J, Schrefl, T, Zeltser, A, Carey, MJ, Petford-Long, AK, C Ward, RCVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610056515
Date:
July, 2010
File:
PDF, 4.69 MB
english, 2010