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Quantitative Convergent Beam Electron Diffraction for Simultaneous Structure Factor and Debye Waller Factor Determination - Fitting Method Optimization
Sang, X, Kulovits, A, Wiezorek, JMKVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610056874
Date:
July, 2010
File:
PDF, 1.38 MB
english, 2010