Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes
Kohno, Y, Shibata, N, Sawada, H, Findlay, SD, Kondo, Y, Ikuhara, YVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057120
Date:
July, 2010
File:
PDF, 867 KB
english, 2010