Development of a Segmented Detector for Aberration...

Development of a Segmented Detector for Aberration Corrected Scanning Transmission Electron Microscopes

Kohno, Y, Shibata, N, Sawada, H, Findlay, SD, Kondo, Y, Ikuhara, Y
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057120
Date:
July, 2010
File:
PDF, 867 KB
english, 2010
Conversion to is in progress
Conversion to is failed