3D Complete-Tilt Electron Tomography of Semiconductor Nanowires
Wu, J, Xie, S, Hemesath, E, Lauhon, L, Dravid, VPVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057302
Date:
July, 2010
File:
PDF, 695 KB
english, 2010