3D Complete-Tilt Electron Tomography of Semiconductor...

3D Complete-Tilt Electron Tomography of Semiconductor Nanowires

Wu, J, Xie, S, Hemesath, E, Lauhon, L, Dravid, VP
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057302
Date:
July, 2010
File:
PDF, 695 KB
english, 2010
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