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Large Solid Angle 50 mm2 SDD for TEM Applications
Barkan, S, Saveliev, VD, Zaluzec, NJ, Tull, CR, Feng, L, Takahashi, MVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057454
Date:
July, 2010
File:
PDF, 1.26 MB
english, 2010