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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
Nellist, PD, Wang, P, Behan, G, Kirkland, AI, Hashimoto, A, Shimojo, M, Mitsuishi, K, Takeguchi, M, Cosgriff, E, D'Alfonso, AJ, Allen, LJ, Findlay, SDVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057533
Date:
July, 2010
File:
PDF, 564 KB
english, 2010