![](/img/cover-not-exists.png)
Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging
Majorovits, E, Barton, B, Benner, G, Dietl, C, Kühlbrandt, W, Lengweiler, S, Mandler, T, Matijevic, M, Niebel, H, Schröder, RVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057740
Date:
July, 2010
File:
PDF, 824 KB
english, 2010