Phase Contrast Aberration Corrected Electron Microscope for...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Phase Contrast Aberration Corrected Electron Microscope for Phase Plate Imaging

Majorovits, E, Barton, B, Benner, G, Dietl, C, Kühlbrandt, W, Lengweiler, S, Mandler, T, Matijevic, M, Niebel, H, Schröder, R
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610057740
Date:
July, 2010
File:
PDF, 824 KB
english, 2010
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