Establishment of Annular Dark-Field Scanning Confocal...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Establishment of Annular Dark-Field Scanning Confocal Electron Microscopy using a Double Aberration-Corrected Microscope

Hashimoto, A, Wang, P, Shimojo, M, Mitsuishi, K, Kirkland, AI, Nellist, PD, Takeguchi, M
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610058022
Date:
July, 2010
File:
PDF, 773 KB
english, 2010
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