![](/img/cover-not-exists.png)
Advantages of Large Area SDD Detectors for Analysis in Analytical TEMs
Rowlands, N, Yamaguchi, S, Ishida, MVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761005854x
Date:
July, 2010
File:
PDF, 316 KB
english, 2010