Interface Structure-Property Relations Through...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Interface Structure-Property Relations Through Aberration-Corrected STEM

Pennycook, SJ, Borisevich, AY, Varela, M, Lupini, AR, Chang, HJ, Leonard, DN, Pennycook, TJ, Oxley, MP, Idrobo, JC, Yurdakul, H, Turan, S, Yu, P, Ramesh, R, Pantelides, ST
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610059787
Date:
July, 2010
File:
PDF, 1.79 MB
english, 2010
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