On Direct Observation of Diffusion by Aberration-Corrected...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

On Direct Observation of Diffusion by Aberration-Corrected HREM

McKeown, JT, Kim, Y-W, Petuskey, WT, O'Keeffe, M, Weierstall, U, Spence, JCH
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610059970
Date:
July, 2010
File:
PDF, 1.41 MB
english, 2010
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