Microfabricated systems for electron microscopy of nanoscale processes: In-situ TEM creation of Si nanowire devices and in-situ SEM electrochemistry
Mølhave, K, Kallesøe, C, Wen, CY, Ross, FM, Booth, T, Kjøller Nellemann, T, Jensen, E, Elkjær, CF, Rasmussen, JL, Jensen, PS, Bøggild, P, Dunin-Borkowski, REVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610060101
Date:
July, 2010
File:
PDF, 295 KB
english, 2010