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Understanding Domain Structures in BiFeO3 Thin Films by Combining Phase-Field Simulations, TEM, and PFM
Sheng, G, Zhang, JX, Winchester, B, Wu, PP, Li, YL, Nelson, CT, Jang, HW, Folkman, CM, Zeches, RJ, Chu, MP, Kalinin, SV, Schlom, DG, Ramesh, R, Eom, C-B, Pan, XQ, Chen, L-QVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610061301
Date:
July, 2010
File:
PDF, 1.51 MB
english, 2010