Recent Advances in EELS Instrumentation and Analysis:...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Recent Advances in EELS Instrumentation and Analysis: Spectroscopy and Filtered Imaging with Extended Energy, Temporal, and Dynamic Range

Twesten, RD, Barfels, M, Trevor, C, Thomas, P, Menon, N, Aitouchen, A, Gubbens, A
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761006201x
Date:
July, 2010
File:
PDF, 261 KB
english, 2010
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