5.4 nm Spatial Resolution Obtained from an Aberration-Corrected Photoemission Electron Microscope Utilizing an Electrostatic Mirror
Word, RC, Rempfer, G, Almaraz, L, Dixon, T, Witham, P, Könenkamp, RVolume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610062318
Date:
July, 2010
File:
PDF, 8.86 MB
english, 2010