Technical Considerations for Improving Near-Field...

Microscopy and Microanalysis 2010 / 7 Vol. 16; Iss. S2

Technical Considerations for Improving Near-Field Enhancement Optical Microscopy

Sánchez, EJ, Nowak, DB, Doughty, JJ, Lawrence, AJ, Delzer, A, Neben, A, Kim, C
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Volume:
16
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927610062677
Date:
July, 2010
File:
PDF, 830 KB
english, 2010
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