Pre-Meeting Congress on Opportunities, Artifacts and...

Microscopy and Microanalysis 2011 / 7 Vol. 17; Iss. S1

Pre-Meeting Congress on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data

Batson, Philip, Muller, David, Allard, Lawrence, Voyles, Paul, Chi, Miofang, O'Keefe, Michael
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Volume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611000729
Date:
July, 2011
File:
PDF, 4.29 MB
english, 2011
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