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Advanced Physical Failure Analysis Techniques Using 3D Rotation Imaging from Plane-View TEM Sample
Kang, H-J, Gwak, J-G, Park, T-S, Back, T-S, Kim, H-J, Han, OVolume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611004041
Date:
July, 2011
File:
PDF, 413 KB
english, 2011