![](/img/cover-not-exists.png)
Characterization of Semiconductor Nanospikes Produced by Focused Ion Beam Erosion
Grossklaus, K, Millunchick, JVolume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611004284
Date:
July, 2011
File:
PDF, 4.49 MB
english, 2011