Aberration Corrected STEM-EELS: Applications to Magnetic Materials
Varela, M, Gazquez, J, Bruno, F, Garcia-Barriocanal, J, Torija, M, Sharma, M, Oxley, M, Prange, M, Pantelides, S, Leighton, C, Leon, C, Santamaria, J, Pennycook, SVolume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611004855
Date:
July, 2011
File:
PDF, 1.16 MB
english, 2011