Advanced Window Grids for Work at the Intersection of...

Microscopy and Microanalysis 2011 / 7 Vol. 17; Iss. S2

Advanced Window Grids for Work at the Intersection of Electron and Optical Imaging

Striemer, C, Gaborski, T
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Volume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611006945
Date:
July, 2011
File:
PDF, 1.74 MB
english, 2011
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