Whisker Formation and Stress Relaxation in Tin Thin Films

Microscopy and Microanalysis 2011 / 7 Vol. 17; Iss. S2

Whisker Formation and Stress Relaxation in Tin Thin Films

Sarobol, P, Pedigo, A, Koppes, J, Wang, Y, Chen, W, Su, P, Blendell, J, Handwerker, C
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Volume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611010105
Date:
July, 2011
File:
PDF, 1.04 MB
english, 2011
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