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Optoelectronic Properties of InAlN/GaN Distributed Bragg Reflector Heterostructure Examined by Valence Electron Energy Loss Spectroscopy
Eljarrat, A., Estradé, S., Gačević, Ž., Fernández-Garrido, S., Calleja, E., Magén, C., Peiró, F.Volume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927612001328
Date:
October, 2012
File:
PDF, 750 KB
english, 2012