Investigation of Ordered-Vacancy Structures in Ga2(Se0.33Te0.67)3 Semiconductors via High-Resolution Electron Microscopy
Abdul-Jabbar, N., Boese, M., Bourret-Courchesne, E., Wirth, B.Volume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927612003704
Date:
July, 2012
File:
PDF, 1.54 MB
english, 2012