High-Speed, Simultaneous EELS and EDS STEM-SI Acquisition
Twesten, R., Longo, P., Aitouchen, A., Thomas, P.J.Volume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927612003947
Date:
July, 2012
File:
PDF, 632 KB
english, 2012