Electron tomography at 2.4 Å resolution
Scott, M.C., Chen, C.C., Mechlenburg, M., Zhu, C., Xu, R., Regan, C., Miao, J., Ercius, P., Dahmen, U.Volume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927612004461
Date:
July, 2012
File:
PDF, 570 KB
english, 2012