Dislocation Analysis in Metal-Oxide Materials and Devices by Electron Channeling Contrast Imaging
Kamaladasa, R., Norman, M., Lu, Y., Bain, J.A., Salvador, P.A., Skowronski, M., De Graef, M., Picard, Y.N.Volume:
18
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927612005387
Date:
July, 2012
File:
PDF, 397 KB
english, 2012