Analysis of Deformation Induced Grain Growth and Texture...

Microscopy and Microanalysis 2013 / 08 Vol. 19; Iss. S2

Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction

Kuebel, C., Kobler, A., Gruber, P., Lohmiller, J., Kraft, O., Braun, C., Grewer, M., Birringer, R., Hahn, H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
19
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927613005515
Date:
August, 2013
File:
PDF, 1005 KB
english, 2013
Conversion to is in progress
Conversion to is failed