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Analysis of Deformation Induced Grain Growth and Texture Development in Electrodeposited Nickel- a Quantitative Comparison between ACOM-STEM and in-situ X-ray Diffraction
Kuebel, C., Kobler, A., Gruber, P., Lohmiller, J., Kraft, O., Braun, C., Grewer, M., Birringer, R., Hahn, H.Volume:
19
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927613005515
Date:
August, 2013
File:
PDF, 1005 KB
english, 2013