Atomic-Resolution Scanning Transmission Electron Microscopy...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

Shibata, N., Findlay, S.D., Ikuhara, Y.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002049
Date:
August, 2014
File:
PDF, 1.09 MB
english, 2014
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