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Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe
Allen, L. J., Brown, H. G., Alfonso, A. J. D’, Ciston, J., Lin, Y., Marks, L. D.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761400213x
Date:
August, 2014
File:
PDF, 1.25 MB
english, 2014