Sample Thickness Determination By Scanning Transmission...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Sample Thickness Determination By Scanning Transmission Electron Microscopy At Low Electron Energies

Volkenandt, T., Müller, E., Gerthsen, D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002438
Date:
August, 2014
File:
PDF, 1.13 MB
english, 2014
Conversion to is in progress
Conversion to is failed