Field Mapping in Semiconductors by Off-axis Electron...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Field Mapping in Semiconductors by Off-axis Electron Holography: From Devices to Graphene and Single Dopant Atoms

Cooper, David, Rouvière, Jean-Luc, Dunin-Borkowski, Rafal
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614002992
Date:
August, 2014
File:
PDF, 1.83 MB
english, 2014
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