A New Design for Measuring Potentials in Operando Nanoelectronic Devices by Electron Holography
He, Kai, Cumings, JohnVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003055
Date:
August, 2014
File:
PDF, 1.20 MB
english, 2014