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Insulator Analysis Using Combined FIB-SEM instrument with TOF-SIMS
Sedláček, Libor, Kološová, Jolana, Jiruše, Jaroslav, Stevie, Fred A.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003250
Date:
August, 2014
File:
PDF, 1.02 MB
english, 2014