Xenon Focused Ion Beam in the Shape Memory Alloys...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl

Kopeček, J., Jurek, K., Kopecký, V., Klimša, L., Seiner, H., Sedlák, P., Landa, M., Dluhoš, J., Petrenec, M., Hladík, L., Doupal, A., Heczko, O.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003390
Date:
August, 2014
File:
PDF, 1011 KB
english, 2014
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