A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips
Prakash Kolli, R., Meisenkothen, FrederickVolume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s143192761400347x
Date:
August, 2014
File:
PDF, 1.38 MB
english, 2014