Resolution Enhancement at Low-Accelerating-Voltage by...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Resolution Enhancement at Low-Accelerating-Voltage by Improvements of Diffraction Limit and Chromatic Aberration

Sawada, H., Sasaki, T., Hosokawa, F., Suenaga, K.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003626
Date:
August, 2014
File:
PDF, 1.07 MB
english, 2014
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