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Measurement of Atomic Fractions in Cu(In,Ga)Se2 Films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA)
Hodoroaba, Vasile-Dan, Wirth, Thomas, Terborg, Ralf, Joong Kim, Kyung, Unger, Wolfgang E. S.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003730
Date:
August, 2014
File:
PDF, 1.45 MB
english, 2014