Interfaces and Extended Structural Defects in Chalcopyrite...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy

Schmidt, S. S., Dietrich, J., Koch, C. T., Schaffer, B., Schaffer, M., Klingsporn, M., Merdes, S., Abou-Ras, D.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614004371
Date:
August, 2014
File:
PDF, 1.22 MB
english, 2014
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