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Aberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters
Parish, Chad M., Miller, Michael K.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614004565
Date:
August, 2014
File:
PDF, 3.05 MB
english, 2014