Quantitative EDX and EELS Elemental Mapping at Atomic...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Quantitative EDX and EELS Elemental Mapping at Atomic Resolution

Kothleitner, G., Neish, M. J., Lugg, N. R., Findlay, S. D., Grogger, W., Hofer, F., Allen, L. J.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614004577
Date:
August, 2014
File:
PDF, 1.28 MB
english, 2014
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