Development of Two Steradian EDX System for the HD-2700...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

Hashimoto, Takahito, Tamura, Keiji, Inada, Hiromi, Watanabe, Keitaro, Ohtsu, Yoshihiro, Suzuki, Yuya, Sato, Takahiro, Kanemura, Takashi, Burgess, Simon, Holland, James, Anderson, Iain, Yamaguchi, Susu
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614004747
Date:
August, 2014
File:
PDF, 874 KB
english, 2014
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