Present State of TEM-SXES Analysis and its Application to...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials

Terauchi, M., Takahashi, H., Handa, N., Murano, T., Koike, M., Imazono, T., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614005133
Date:
August, 2014
File:
PDF, 834 KB
english, 2014
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