Optimization of Focused Ion Beam-Tomography for...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Optimization of Focused Ion Beam-Tomography for Superconducting Electronics

Sanders, Aric, Fox, Anna, Dresselhaus, Paul, Curtin, Alexandra
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614005583
Date:
August, 2014
File:
PDF, 1.31 MB
english, 2014
Conversion to is in progress
Conversion to is failed