The SECOM Platform: an Integrated CLEM Solution
den Hoedt, S.V., Effting, A.P.J., Haring, M.T.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006758
Date:
August, 2014
File:
PDF, 879 KB
english, 2014