Imaging Extended Defects by TEM

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Imaging Extended Defects by TEM

Barry Carter, C.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006825
Date:
August, 2014
File:
PDF, 5.93 MB
english, 2014
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