Nano-scale Strain Mapping Using Advanced STEM with a Direct...

Microscopy and Microanalysis 2014 / 08 Vol. 20; Iss. S3

Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector

Ozdol, V. B., Gammer, C., Sarahan, M.C., Minor, A. M.
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Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614006953
Date:
August, 2014
File:
PDF, 3.79 MB
english, 2014
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